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NSN Information for Part Number B2S129W with NSN 5962-01-075-8005, 5962010758005

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-01-075-8005 Item Description: Microcircuit Memory	5962	010758005	0	N	B
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
	7		B	U
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
B2s129w	2	9	5

Characteristics Data of NSN 5962-01-075-8005, 5962010758005

MRC	Criteria	Characteristic
ADAT	BODY WIDTH	0.240 INCHES MINIMUM AND 0.325 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.085 INCHES MAXIMUM
AFGA	OPERATING TEMP RANGE	55.0/+125.0 DEG CELSIUS
CBBL	FEATURES PROVIDED	HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND W/STORAGE AND PROGRAMMED AND SCHOTTKY AND BIPOLAR AND 3-STATE OUTPUT
CQSJ	INCLOSURE MATERIAL	CERAMIC AND GLASS
CQWX	OUTPUT LOGIC FORM	TRANSISTOR-TRANSISTOR LOGIC
CWSG	TERMINAL SURFACE TREATMENT	SOLDER
CZEQ	TIME RATING PER CHACTERISTIC	5.00 NANOSECONDS MINIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 35.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 10.00 NANOSECONDS MINIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT AND 89.0
CZZZ	MEMORY CAPACITY	UNKNOWN
ADAQ	BODY LENGTH	0.440 INCHES MAXIMUM
AFJQ	STORAGE TEMP RANGE	-65.0/+150.0 DEG CELSIUS
CQSZ	INCLOSURE CONFIGURATION	FLAT PACK
CQZP	INPUT CIRCUIT PATTERN	10 INPUT
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	7.0 VOLTS MAXIMUM TOTAL SUPPLY
CZER	MEMORY DEVICE TYPE	PROM
TEST	TEST DATA DOCUMENT	82577-932820 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
TTQY	TERMINAL TYPE AND QUANTITY	16 PRINTED CIRCUIT

Corresponding National Stock Number to B2S129W

B2S3 230V60CPS	B2SNR004	B2SA	B2SA
B2S3230V	B2S3230V	B2S3-230V60CPS	B2S22
B2S-H32SS	B2S-A48SS	B2STYLEB2-4	B2SR625 65
B2SNR058CP	B2SNR058	B2SNR004CP	B2SNR004CP
B2SNR004

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NSN Information for Part Number B2S129W with NSN 5962-01-075-8005, 5962010758005

Characteristics Data of NSN 5962-01-075-8005, 5962010758005

Corresponding National Stock Number to B2S129W

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